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Send InquiryScanning Electron Microscopy (SEM) Services
Scanning Electron Microscopy (SEM) Services Specification
- Usage & Applications
- Surface Morphology Analysis, Failure Analysis, Composition Analysis in Pharmaceuticals, Electronics, Engineering, and Materials Science
- Voltage
- 0.5 kV to 30 kV
- Power
- 220-240 V AC
- Interface
- Digital/Computerized Interface
- Frequency
- 50 Hz/60 Hz
- Measuring Range
- Up to 500,000x Magnification
- Driven Type
- Electron Beam Driven
- Size
- Custom/Project Dependent
- Display
- Digital Display
- Temperature
- Ambient/Project Specific
- Data Format
- JPEG, TIFF, BMP, or as required
- Compatibility
- Metals, Ceramics, Polymers, Biological Samples, Thin Films
- Scanning Area
- Up to 50 mm
- Resolution
- Up to 1 nm
- Service Turnaround Time
- 2-7 Working Days
- Environment
- Vacuum Chamber Operation
- Image Output
- Digital Image Files
- Detector Type
- Secondary Electron Detector (SED), Backscattered Electron Detector (BSED)
- Analysis Capability
- Topographical, Elemental (EDS/EDX add-on)
- Operation Mode
- High Vacuum and Low Vacuum options
- Sample Preparation
- Required; Sputter-coating for non-conductive samples
- Sample Size Limit
- Maximum 30 mm diameter
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Contact Details
GST : 24ABCFM5326J1ZC
Shed No 4, Abhinav Arcade, Astha Complex Viratnagar, SP Ring Road Cross Odhav, Ahmedabad - 382415, Gujarat, India
Phone :08045476609
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