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    Scanning Electron Microscopy (SEM) Services
    Scanning Electron Microscopy (SEM) Services
    Scanning Electron Microscopy (SEM) Services
    Scanning Electron Microscopy (SEM) Services
    Scanning Electron Microscopy (SEM) Services
    Scanning Electron Microscopy (SEM) Services

    Scanning Electron Microscopy (SEM) Services

    Scanning Electron Microscopy (SEM) Services Specification

    • Temperature
    • Ambient/Project Specific
    • Usage & Applications
    • Surface Morphology Analysis, Failure Analysis, Composition Analysis in Pharmaceuticals, Electronics, Engineering, and Materials Science
    • Voltage
    • 0.5 kV to 30 kV
    • Frequency
    • 50 Hz/60 Hz
    • Interface
    • Digital/Computerized Interface
    • Display
    • Digital Display
    • Measuring Range
    • Up to 500,000x Magnification
    • Size
    • Custom/Project Dependent
    • Power
    • 220-240 V AC
    • Driven Type
    • Electron Beam Driven
    • Detector Type
    • Secondary Electron Detector (SED), Backscattered Electron Detector (BSED)
    • Service Turnaround Time
    • 2-7 Working Days
    • Operation Mode
    • High Vacuum and Low Vacuum options
    • Sample Size Limit
    • Maximum 30 mm diameter
    • Environment
    • Vacuum Chamber Operation
    • Image Output
    • Digital Image Files
    • Compatibility
    • Metals, Ceramics, Polymers, Biological Samples, Thin Films
    • Data Format
    • JPEG, TIFF, BMP, or as required
    • Analysis Capability
    • Topographical, Elemental (EDS/EDX add-on)
    • Sample Preparation
    • Required; Sputter-coating for non-conductive samples
    • Resolution
    • Up to 1 nm
    • Scanning Area
    • Up to 50 mm
     
     
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